Publications and References

Characterization of the ANITA Neutron Source for Accelerated SEE Testing
at The Svedberg Laboratory

A. V. Prokofiev, J. Blomgren, M. Majerle, R. Nolte, S. Röttger, S. P. Platt, C. X. Xiao, and A. N. Smirnov, "NSREC’2009, Radiation Effects Data Workshop", Quebec, July 20-24, 2009.

(PDF-fomat)

ANITA – a New Neutron Facility for Accelerated SEE Testing at The Svedberg Laboratory

A. V. Prokofiev, J. Blomgren, R. Nolte, S. P. Platt, S. Röttger, and A. N. Smirnov,” 2009 IEEE International Reliability Physics Symposium", April 26-30, 2009, Montreal, Quebec, Canada.

(PDF-format)

JESD-89

JEDEC, a branch of Electronics Industry Alliance of USA, has issued a standard on SEE testing. TSL is the only laboratory in the world that can deliver a full mono-energetic neutron in agreement with the JESD-89 protocol.

Materials Research Society Bulletin, February 2003, Volume 28, No. 2.

This is a topical issue entitled Single-Event Upsets in Microelectronics, eds. H. Tang and N. Olsson. It contains several overview articles which outline the whole area. Unfortunately, the entire volume is not available electronically.

Relations between basic nuclear data and single event upsets phenomena

An overview article by J. Blomgren, B. Granbom, T. Granlund and N. Olsson in the MRS volume above on the nuclear reactions ultimately causing SEE, and how this information can be extracted from mono-energetic neutron testing of electronics devices. 2003 (PDF)